Brescia, Italy

Marco Lombardi

This inventor holds 1 USPTO granted patent. Top assignee: Faro Technologies, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marco Lombardi. Retrieved from https://idiyas.com/inventor/marco-lombardi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Marco Lombardi: Innovator in 3D Scanning Technology

Introduction

Marco Lombardi is a notable inventor based in Brescia, Italy. He has made significant contributions to the field of measurement technology, particularly in the area of three-dimensional (3D) scanning. His innovative approach combines machine learning with natural feature detection to enhance the accuracy of handheld scanners.

Latest Patents

Lombardi holds a patent for "Targetless tracking of measurement device during capture of surrounding data." This patent describes technical solutions for tracking a handheld 3D scanner in various environments by utilizing natural features. The method involves detecting these features through machine learning, filtering them via stereo matching of images captured by the scanner, and further refining the data using time matching between images taken at different time points. He has 1 patent to his name.

Career Highlights

Marco Lombardi is currently employed at Faro Technologies, Inc., a company renowned for its advanced 3D measurement and imaging solutions. His work at Faro has allowed him to push the boundaries of what is possible in 3D scanning technology.

Collaborations

Throughout his career, Lombardi has collaborated with talented individuals such as Francesco Bonarrigo and Andrea Riccardi. These partnerships have contributed to the development of innovative solutions in the field of measurement technology.

Conclusion

Marco Lombardi's contributions to 3D scanning technology exemplify the impact of innovation in measurement devices. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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