Pavia, Italy

Marco Catellano

This inventor holds 1 USPTO granted patent. Top assignee: Stmicroelectronics S.r.l.. Active years: 2021.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Marco Catellano: Innovator in Step Counting Technology

Introduction

Marco Catellano is a notable inventor based in Pavia, Italy. He has made significant contributions to the field of electronic devices, particularly in the area of step counting technology. His innovative approach focuses on enhancing the accuracy of step detection through advanced methodologies.

Latest Patents

Marco Catellano holds a patent for an "Electronic device for performing step counting with false-positive rejection." This invention involves a method that receives multi-axis accelerometer data representing a potential step taken by a user. The method determines whether the potential step is a false positive by calculating statistical data from the accelerometer data and applying a decision tree for cross-correlation. If the potential step is confirmed as countable, a step counter is incremented, thereby improving the reliability of step counting in electronic devices. He has 1 patent to his name.

Career Highlights

Marco Catellano is currently employed at STMicroelectronics S.r.l., a leading company in semiconductor solutions. His work at STMicroelectronics has allowed him to develop and refine his innovative ideas, contributing to the advancement of technology in consumer electronics.

Collaborations

Throughout his career, Marco has collaborated with talented individuals such as Alessia Cagidiaco and Marco Leo. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Marco Catellano exemplifies the spirit of innovation in the field of electronic devices. His contributions, particularly in step counting technology, highlight the importance of accuracy and reliability in modern electronic applications.

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