Company Filing History:
Years Active: 2011-2021
Title: Marco Alberto Carlo Potenza: Innovator in Radiation Analysis
Introduction
Marco Alberto Carlo Potenza is a distinguished inventor based in Milan, Italy. He has made significant contributions to the field of particle characterization through innovative methods and instruments. With a total of two patents to his name, Potenza's work focuses on the analysis of scattered radiation, which has important applications in various scientific and industrial fields.
Latest Patents
Potenza's latest patents include a "Method for the characterization of objects by means of scattered radiation analysis and related instrumentations." This method involves generating a radiation beam to illuminate a particle object, collecting interference images, and measuring scattered radiation intensity values. The process allows for the calculation of complex fields and comparison of measured values with theoretical predictions.
Another notable patent is the "Method of measuring properties of particles and corresponding apparatus." This method generates a beam of radiation that interacts with particles, allowing for the detection of radiation intensity values. By analyzing the trends of phase delay and amplitude of the scattered radiation, the properties of the particles can be determined over time.
Career Highlights
Throughout his career, Potenza has worked with esteemed institutions such as Università degli Studi di Milano and Eos S.r.l. His experience in these organizations has contributed to his expertise in radiation analysis and particle characterization.
Collaborations
Potenza has collaborated with various professionals in his field, including his coworker Marzio Giglio. These collaborations have further enhanced his research and development efforts in innovative technologies.
Conclusion
Marco Alberto Carlo Potenza is a prominent inventor whose work in radiation analysis has paved the way for advancements in particle characterization. His patents reflect a deep understanding of the complexities involved in measuring and analyzing scattered radiation.