The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
May. 18, 2018
Eos S.r.l., Milan, IT;
Marco Alberto Carlo Potenza, Milan, IT;
EOS S.R.L., Milan, IT;
Abstract
A method for characterizing particle objects comprises generating a radiation beam, illuminating with the radiation beam an observation region transited by a particle object, collecting an interference image determined by an interference between a transmitted fraction and a part of the scattered fraction of the radiation beam that propagates around the direction of the optical axis, collecting a part of the scattered fraction that propagates at the scattering angle, and measuring at least one scattered radiation intensity value determined by the part of the scattered fraction, calculating, from the interference image, a pair of independent quantities that define the complex field of the first part of the scattered fraction, calculating, starting from the pair of independent quantities, a theoretical value of scattered radiation intensity, and comparing the measured value with the theoretical scattered radiation intensity value.