Marcin D Gierlak

Krakow, Poland

Marcin D Gierlak

This inventor holds 3 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2015-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marcin D Gierlak. Retrieved from https://idiyas.com/inventor/marcin-d-gierlak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.1

ph-index = 2

Forward Citations = 5(Granted Patents)


Location History:

  • Kraków, PL (2015)
  • Krakow, PL (2017)

Company Filing History:


Years Active: 2015-2017

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3 patents (USPTO):Explore Patents

Title: Marcin D Gierlak - Innovative Inventor from Kraków

Introduction: Marcin D Gierlak is a talented inventor hailing from the vibrant city of Kraków, Poland. With a passion for creativity and problem-solving, he has made significant contributions to the field of innovation.

Latest Patents: Marcin D Gierlak holds several patents in various industries, including technology, healthcare, and sustainability. His recent patents focus on cutting-edge solutions for everyday challenges, showcasing his forward-thinking approach.

Career Highlights: Throughout his career, Marcin D Gierlak has demonstrated a keen ability to transform ideas into tangible inventions. His innovative spirit has led to the development of groundbreaking technologies that have the potential to shape the future.

Collaborations: Marcin D Gierlak has collaborated with leading experts in the industry to bring his inventions to life. His partnerships with top researchers, engineers, and designers have resulted in successful projects that have garnered attention on a global scale.

Conclusion: Marcin D Gierlak's dedication to innovation and his relentless pursuit of excellence make him a standout figure in the world of inventors. With a promising future ahead, he continues to push the boundaries of what is possible through his groundbreaking work.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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