Sebastian, FL, United States of America

Marcelo Jakubzick

This inventor holds 1 USPTO granted patent. Top assignee: M.c. Miller Co.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marcelo Jakubzick. Retrieved from https://idiyas.com/inventor/marcelo-jakubzick

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Biography of Inventor Marcelo Jakubzick

Introduction

Marcelo Jakubzick is an innovative inventor based in Sebastian, Florida. He has made significant contributions to the field of cathodic protection through his patented invention.

Latest Patents

Marcelo holds a patent for "Monitoring methods, systems and apparatus for validating the operation of a current interrupter used in cathodic protection." This invention includes systems, methods, and apparatus for continuously and independently monitoring the operation of a current interrupter. It is designed to test a cathodic protection system, ensuring proper operation through independent verification.

Career Highlights

Marcelo is associated with M.C. Miller Co., where he applies his expertise in developing innovative solutions for cathodic protection systems. His work focuses on enhancing the reliability and effectiveness of these systems.

Collaborations

Throughout his career, Marcelo has collaborated with notable colleagues, including Melvin C. Miller and Juan Pablo Gutierrez. These collaborations have contributed to the advancement of technology in their field.

Conclusion

Marcelo Jakubzick's contributions to the field of cathodic protection through his innovative patent demonstrate his commitment to improving safety and efficiency in monitoring systems. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…