Southfield, MI, United States of America

Marc S Black

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marc S Black. Retrieved from https://idiyas.com/inventor/marc-s-black-nrc6mq33

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Marc S. Black

Introduction

Marc S. Black is an accomplished inventor based in Southfield, MI (US). He is known for his contributions to the field of vehicle instrumentation. With a focus on enhancing user experience in automotive design, Black has made significant strides in his career.

Latest Patents

Marc S. Black holds a patent for a vehicle instrument panel. This innovation aims to improve the functionality and aesthetics of vehicle dashboards, making them more user-friendly and efficient. He has 1 patent to his name, showcasing his expertise in automotive technology.

Career Highlights

Black is currently employed at General Electric Company, where he continues to develop innovative solutions in the automotive sector. His work at GE has allowed him to collaborate with some of the brightest minds in the industry, further enhancing his skills and contributions.

Collaborations

Some of his notable coworkers include Kenneth C. Sherman, III and Albert Wan-Hsi Chan. Their collaborative efforts have led to advancements in various projects, contributing to the overall success of their initiatives.

Conclusion

Marc S. Black is a notable inventor whose work in vehicle instrumentation has made a lasting impact on the automotive industry. His dedication to innovation and collaboration continues to drive advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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