Rüsselsheim, Germany

Marc Fuerst

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Gm Global Technolgoy Operations, Inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marc Fuerst. Retrieved from https://idiyas.com/inventor/marc-fuerst

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Marc Fuerst: Inventor of an Acceleration-Aware Input Device.

Introduction

Marc Fuerst is an inventor associated with Rüsselsheim, Germany. His patent work includes an input device designed to translate touch interactions into control commands while accounting for acceleration affecting the sensor surface.

Latest Patents

Fuerst is credited with 1 patent. His patent, “Input device,” describes a touch-sensitive surface and an evaluation unit that detects the positions of successive touches and converts them into a command for a device. The evaluation unit estimates acceleration acting on the surface and gives less weight to touches made during intense acceleration changes than to touches made during slight changes. This approach is intended to help distinguish deliberate input from touch movements affected by acceleration.

Career Highlights

Fuerst is associated with GM Global Technology Operations, Inc. His patent reflects work on input technology that adapts touch interpretation to changing physical conditions.

Collaborations

David Voss and Andreas Lang are identified as Fuerst’s coworkers. The available information does not specify their roles in the patent or their contributions to its development.

Conclusion

Marc Fuerst’s patented input device combines touch sensing with acceleration-aware evaluation, illustrating an approach to making device controls more responsive to their operating conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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