Montreal, Canada

Marc Dubois

This inventor holds 1 USPTO granted patent. Top assignee: American Iron and Steel Institute. Active years: 2000.


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 200(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Marc Dubois

Introduction

Marc Dubois is a notable inventor based in Montreal, Canada. He has made significant contributions to the field of laser-ultrasound technology. His work focuses on enhancing measurement accuracy and understanding the properties of various materials.

Latest Patents

Marc Dubois holds a patent for a "Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances." This invention includes a structure and steps for applying a radiation pulse from a pulsed source of radiation to an object. It generates elastic waves within the object, which are then optically detected and analyzed. The detection of shear resonances, either alone or in combination with other information, improves thickness measurement accuracy and helps determine the geometrical, microstructural, and physical properties of the object. The use of laser-ultrasound spectroscopy is preferred for detecting these shear resonances.

Career Highlights

Marc Dubois is associated with the American Iron and Steel Institute, where he applies his expertise in laser-ultrasound technology. His innovative approach has contributed to advancements in material analysis and measurement techniques.

Collaborations

Marc has collaborated with notable colleagues, including Daniel Levesque and Andre Moreau. Their combined efforts have furthered research and development in their respective fields.

Conclusion

Marc Dubois is a distinguished inventor whose work in laser-ultrasound technology has made a significant impact on material analysis. His patent and collaborations reflect his commitment to innovation and excellence in his field.

Profile summary based on public USPTO records.
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