This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, Commissariat a L'energie Atomique Et Aux Energies Alternatives, Université De Lille. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:



Years Active: 2024
Title: The Innovations of Marc Douay
Introduction
Marc Douay is a notable inventor based in Villeneuve d'Ascq, France. He has made significant contributions to the field of optical fibers, particularly in the area of distributed measurement of temperature and deformation. His innovative approach has led to the development of a unique optical fiber that can withstand harsh environments.
Latest Patents
Marc Douay holds a patent for a "Method for producing an optical fibre for a distributed measurement of temperature or deformation in a harsh environment using the Rayleigh backscattered signal." This optical fiber is designed for use in optical reflectometry and includes a core doped with nanoparticles, such as gold particles covered with zirconium oxide. The fiber can endure high temperatures during measurements, and the production method involves a heat treatment process that exceeds the maximum temperature the fiber will face during actual use.
Career Highlights
Throughout his career, Marc Douay has worked with prestigious institutions, including the Centre National de la Recherche Scientifique and the Université de Lille. His work has been instrumental in advancing the technology behind optical fibers and their applications in various fields.
Collaborations
Marc has collaborated with notable colleagues, including Remy Bernard and Guillaume Laffont, contributing to the development of innovative solutions in optical measurement technologies.
Conclusion
Marc Douay's contributions to the field of optical fibers demonstrate his commitment to innovation and excellence. His patented methods and collaborative efforts continue to influence advancements in temperature and deformation measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile