Shenzhen, China

Manman Ma

This inventor holds 1 USPTO granted patent. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manman Ma. Retrieved from https://idiyas.com/inventor/manman-ma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Years Active: 2020

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Journey of Manman Ma

Introduction

Manman Ma is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of technology with his innovative ideas and inventions. His work reflects a commitment to advancing practical solutions that address real-world problems.

Latest Patents

One of Manman Ma's most recent patents is the Combined Temperature Measuring Gun. This invention showcases his ability to integrate technology in a way that enhances user experience and efficiency. The patent highlights his innovative approach to temperature measurement, which is crucial in various applications.

Career Highlights

Throughout his career, Manman Ma has demonstrated a strong dedication to innovation. His work has not only contributed to his personal growth as an inventor but has also impacted the industry positively. With a patent portfolio that includes 1 patent, he continues to push the boundaries of what is possible in technology.

Collaborations

Manman Ma has collaborated with talented individuals such as Tingyuan Luo and Dian Zhang. These partnerships have allowed him to combine expertise and creativity, leading to successful projects and inventions.

Conclusion

In summary, Manman Ma is an inspiring inventor whose work in Shenzhen, China, exemplifies innovation and collaboration. His contributions, particularly the Combined Temperature Measuring Gun, highlight his commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…