Bengaluru, India

Mani Sivaraman

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mani Sivaraman. Retrieved from https://idiyas.com/inventor/mani-sivaraman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 12.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations by Mani Sivaraman

Introduction

Mani Sivaraman is an accomplished inventor based in Bengaluru, India. He has made significant contributions to the field of non-volatile memory devices. His innovative approach has led to the development of a unique system designed to enhance data integrity.

Latest Patents

Mani holds a patent for a "System and method for detection and prevention of flash corruption." This invention involves a non-volatile memory device that includes an application code sector capable of storing two copies of application code. The device features a boot sector containing boot loader code that checks the integrity of both copies. If one copy is found to be corrupted, the device automatically overwrites it with the other copy, ensuring data reliability.

Career Highlights

Mani Sivaraman is currently employed at Honeywell International Inc., where he continues to innovate and contribute to advancements in technology. His work focuses on improving the reliability and performance of memory devices, which are critical in various applications.

Collaborations

Some of Mani's coworkers include Puja Chopra and Shruti Kop. Their collaborative efforts contribute to the innovative environment at Honeywell, fostering the development of cutting-edge technologies.

Conclusion

Mani Sivaraman's contributions to the field of non-volatile memory devices exemplify the importance of innovation in technology. His patent reflects a commitment to enhancing data integrity and reliability in modern applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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