VS-Schwenningen, Germany

Manfred Schrenk

This inventor holds 1 USPTO granted patent. Top assignee: Jenoptik Aktiengesellschaft. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Schrenk. Retrieved from https://idiyas.com/inventor/manfred-schrenk-sweoxmfh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Manfred Schrenk: Innovator in Partial Pressure Sensing

Introduction

Manfred Schrenk is a notable inventor based in VS-Schwenningen, Germany. He has made significant contributions to the field of sensor technology, particularly with his innovative work on partial pressure sensors. His expertise and dedication to precision measurement have positioned him as a key figure in his industry.

Latest Patents

Manfred Schrenk holds a patent for a partial pressure sensor. This sensor is designed to determine the partial pressure of a gas or vapor in a thermally uncontrolled gas atmosphere. It operates effectively over a large measurement range while maintaining high measuring accuracy. This innovation showcases his commitment to advancing measurement technologies.

Career Highlights

Schrenk is associated with Jenoptik Aktiengesellschaft, a company known for its cutting-edge technology and solutions. His role at Jenoptik has allowed him to collaborate with other talented professionals in the field. His work has contributed to the company's reputation for excellence in sensor technology.

Collaborations

Some of his notable coworkers include Peter Weissbrodt and Erich Hacker. Their collaboration has fostered an environment of innovation and creativity, leading to advancements in sensor technology.

Conclusion

Manfred Schrenk's contributions to the field of partial pressure sensing exemplify his innovative spirit and technical expertise. His work continues to influence the industry and inspire future advancements in measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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