Jena, Germany

Manfred Matz


Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2006-2007

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2 patents (USPTO):Explore Patents

Title: Manfred Matz: Innovator in Position Measurement Technology

Introduction

Manfred Matz is a notable inventor based in Jena, Germany. He has made significant contributions to the field of position measurement technology, holding 2 patents that showcase his innovative approach to scanning devices and optical position measuring systems.

Latest Patents

Matz's latest patents include a "Scanning device for scanning a scale graduation" and an "Optical position measuring device." The scanning device is designed to detect relative movements of the scanning device with respect to the scale graduation. It features a first and second primary sensor field for detecting movements along a first spatial direction, as well as a first and second secondary sensor field for movements along a second spatial direction. These sensor fields are arranged point-symmetrically in relation to a mid-point in a plane. The optical position measuring device consists of an incremental measuring graduation and a scanning unit that generates position-dependent incremental signals. The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements, each equipped with a light source and several detector elements.

Career Highlights

Throughout his career, Matz has worked with Dr. Johannes Heidenhain GmbH, where he has further developed his expertise in measurement technology. His work has significantly impacted the industry, particularly in the design and functionality of scanning devices.

Collaborations

Matz has collaborated with notable professionals in his field, including Reiner Burgschat and Janos Böhme. These collaborations have contributed to the advancement of technology in position measurement.

Conclusion

Manfred Matz's innovative work in scanning devices and optical position measuring systems has established him as a key figure in the field of measurement technology. His patents reflect a commitment to advancing the capabilities of position measurement, making a lasting impact on the industry.

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