Munich, Germany

Manfred Lang

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Lang. Retrieved from https://idiyas.com/inventor/manfred-lang-0izr02lz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Manfred Lang - Innovator in Holographic Data Storage

Introduction

Manfred Lang is a notable inventor based in Munich, Germany. He has made significant contributions to the field of data storage technology. His innovative approach has led to the development of a unique method for holographic storage of data.

Latest Patents

Lang holds a patent for an "Apparatus and method for holographic storage of data." This invention utilizes a light source and a number of light deflectors, allowing a single beam to read data from multiple holograms simultaneously. This advancement has the potential to revolutionize data storage efficiency.

Career Highlights

Manfred Lang is associated with Siemens Aktiengesellschaft, a leading global technology company. His work at Siemens has allowed him to explore and develop cutting-edge technologies in data storage. Lang's innovative spirit and technical expertise have positioned him as a key player in his field.

Collaborations

Throughout his career, Lang has collaborated with notable colleagues, including Ulrich V Hundelshausen and Hans Eschler. These collaborations have fostered an environment of innovation and creativity, contributing to the advancement of technology in their respective areas.

Conclusion

Manfred Lang's contributions to holographic data storage exemplify the impact of innovation in technology. His work continues to inspire advancements in data storage solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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