Pirching, Austria

Manfred Krenn

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Anton Paar Gmbh. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Krenn. Retrieved from https://idiyas.com/inventor/manfred-krenn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Manfred Krenn: Innovator in Fluid Density Measurement

Introduction

Manfred Krenn is a notable inventor based in Pirching, Austria. He has made significant contributions to the field of fluid measurement technology. His innovative approach has led to the development of a unique method and instrument for measuring the density of fluid media.

Latest Patents

Krenn holds a patent for a "Method and instrument for measuring the density of fluid media." This invention utilizes a sensor equipped with a density measuring device. The technology incorporates a frequency oscillator with mass balance as the density sensor. All components related to the frequency oscillator are enclosed in a housing or cartridge. This design allows for precise measurement and calibration tailored to specific applications.

Career Highlights

Manfred Krenn is associated with Anton Paar GmbH, a company renowned for its advanced measurement technology. His work has been instrumental in enhancing the accuracy and efficiency of fluid density measurements. Krenn's innovative solutions have positioned him as a key figure in his field.

Collaborations

Krenn has collaborated with talented colleagues such as Anton Scheibelmasser and Julia Ganser. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Manfred Krenn's contributions to fluid density measurement technology exemplify his innovative spirit and dedication to advancing measurement solutions. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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