Munich, Germany

Manfred Kempe

This inventor holds 1 USPTO granted patent. Top assignee: Cambridge Instruments Inc.. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Kempe. Retrieved from https://idiyas.com/inventor/manfred-kempe-io490kty

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Manfred Kempe: Innovator in Microtome Technology

Introduction

Manfred Kempe is a notable inventor based in Munich, Germany. He has made significant contributions to the field of microtome technology, particularly with his innovative designs that enhance precision and functionality. His work is characterized by a commitment to improving the efficiency and accuracy of scientific instruments.

Latest Patents

Kempe holds a patent for a "Backlash-free drive for the infeed mechanism of a microtome." This invention features a threaded spindle that is rotatable but axially non-shiftable, along with two nut elements that are non-rotatable yet can shift axially relative to one another. The design incorporates spring-loaded nut elements to ensure acceptable tolerances for the conicity of the threaded spindle. Additionally, the invention includes plain bearings to protect the thread from deformation and frictional clutches to prevent excessive driving torques. This allows users to operate the micrometer with either manual or automatic feed options.

Career Highlights

Kempe is associated with Cambridge Instruments Inc., where he applies his expertise in developing advanced microtome technologies. His work has been instrumental in enhancing the capabilities of scientific instruments used in various research fields.

Conclusion

Manfred Kempe's contributions to microtome technology exemplify innovation in scientific instrumentation. His patented designs reflect a deep understanding of mechanical engineering and a dedication to improving research tools.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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