Wetzlar, Germany

Manfred Kartzow

This inventor holds 1 USPTO granted patent. Top assignee: Ernst Leitz Wetzlar Gmbh. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Kartzow. Retrieved from https://idiyas.com/inventor/manfred-kartzow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Manfred Kartzow: Innovator in Optical Technology

Introduction

Manfred Kartzow is a notable inventor based in Wetzlar, Germany. He has made significant contributions to the field of optical technology. His work has led to the development of innovative devices that enhance precision in various applications.

Latest Patents

Kartzow holds a patent for a "Device for automatically determining the deviation between the." This invention showcases his expertise in creating solutions that improve accuracy and efficiency in optical measurements. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Kartzow is associated with Ernst Leitz Wetzlar GmbH, a company renowned for its advancements in optical instruments. His role at the company has allowed him to work on cutting-edge technologies that have a lasting impact on the industry. His dedication to his craft is evident in the quality of his work.

Collaborations

One of his notable coworkers is Erich Schuster. Together, they have contributed to the development of various optical technologies, enhancing the capabilities of their company.

Conclusion

Manfred Kartzow's contributions to optical technology through his patent and work at Ernst Leitz Wetzlar GmbH highlight his role as an innovator in the field. His dedication to precision and accuracy continues to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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