Notzingen, Germany

Manfred Huttner

This inventor holds 1 USPTO granted patent. Top assignee: Pebra Gmbh Paul Braun. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Huttner. Retrieved from https://idiyas.com/inventor/manfred-huttner-u33qj0y8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Manfred Huttner: Innovator in Synthetic Plastic Molding Technology

Introduction

Manfred Huttner is a notable inventor based in Notzingen, Germany. He has made significant contributions to the field of synthetic plastic molding. His innovative approach has led to the development of a unique patent that enhances the production process of molded parts.

Latest Patents

Huttner holds a patent for an "Arrangement for producing synthetic plastic molded parts." This invention involves a sophisticated mechanism where a sprue part is separated from the molded part using a displacing slider. This slider works in conjunction with a limiting surface to effectively displace a sprue film from a sprue gap. Additionally, another displacing slider is utilized to separate an overflow part from the molded part, ensuring efficient production and quality control.

Career Highlights

Manfred Huttner is associated with Pebra GmbH Paul Braun, where he applies his expertise in synthetic plastic technology. His work at the company has been instrumental in advancing the methods used in the production of molded plastic parts. Huttner's innovative solutions have positioned him as a key figure in the industry.

Collaborations

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Conclusion

Manfred Huttner's contributions to synthetic plastic molding technology exemplify the impact of innovation in manufacturing processes. His patent reflects a commitment to improving efficiency and quality in production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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