Manfred Geier

Title: Manfred Geier: Innovator in Impedance Measurement Technologies

Introduction

Manfred Geier is a notable inventor based in Oakland, CA, who has made significant contributions to the field of impedance measurement technologies. With a total of 9 patents to his name, Geier's work focuses on innovative methods and systems that enhance the accuracy and efficiency of dielectric measurements.

Latest Patents

Geier's latest patents include advanced methods, circuits, and systems for obtaining impedance or dielectric measurements of a material under test. These methods involve transmitting an excitation signal into the material under test (MUT) and a reference signal to a set of magnitude and phase (M/P) detectors. The process includes receiving the response signal and separately comparing the magnitude and phase of both the excitation and reference signals with corresponding detection ranges for the M/P detectors. The system iteratively adjusts the excitation and reference signals until the response signal meets the required detection ranges, ensuring precise measurements.

Career Highlights

Manfred Geier is currently employed at Transtech Systems, Inc., where he continues to develop innovative solutions in the field of measurement technologies. His expertise and dedication to research have positioned him as a key figure in his industry.

Collaborations

Throughout his career, Geier has collaborated with talented individuals such as Adam D Blot and Andrew J Westcott. These partnerships have contributed to the advancement of his projects and the successful development of new technologies.

Conclusion

Manfred Geier's contributions to impedance measurement technologies reflect his commitment to innovation and excellence. His patents and work at Transtech Systems, Inc. continue to influence the field and inspire future advancements.