Norderstedt, Germany

Manfred Biehl

This inventor holds 3 USPTO granted patents. Top assignee: U.S. Philips Corporation. Active years: 1998-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Biehl. Retrieved from https://idiyas.com/inventor/manfred-biehl-uv0d707b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1998-2000

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3 patents (USPTO):Explore Patents

Title: Manfred Biehl: Innovator in Frequency Control Technology

Introduction

Manfred Biehl is a notable inventor based in Norderstedt, Germany. He has made significant contributions to the field of frequency control technology, holding a total of 3 patents. His work has been instrumental in advancing the capabilities of various electronic systems.

Latest Patents

Among his latest patents, Biehl has developed a method for the production of a frequency control signal in an FSK receiver. Additionally, he has created a circuit arrangement featuring a filter quadripole. These innovations demonstrate his expertise in circuit design and signal processing.

Career Highlights

Biehl is associated with U.S. Philips Corporation, where he has applied his skills in developing cutting-edge technologies. His work at this esteemed company has allowed him to contribute to various projects that enhance electronic communication systems.

Collaborations

Throughout his career, Biehl has collaborated with notable colleagues, including Winfried B. Jansen and Burkhard Dick. These partnerships have fostered a creative environment that has led to innovative solutions in their respective fields.

Conclusion

Manfred Biehl's contributions to frequency control technology and his collaborations with other experts highlight his importance in the field of electronics. His patents reflect a commitment to innovation and excellence in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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