This inventor holds 1 USPTO granted patent. Top assignee: United States of America as Represented by the Administrator of NASA. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Manal A Khreishi: Innovator in Metrology and Uncertainty Propagation
Introduction
Manal A Khreishi is a prominent inventor based in Upper Marlboro, MD (US). She has made significant contributions to the field of metrology through her innovative patent. Her work focuses on uncertainty propagation, which is crucial for enhancing the accuracy and reliability of measurements in various applications.
Latest Patents
Khreishi holds a patent titled "Universal and automated Monte Carlo method code for uncertainty propagation in metrology databases." This patent describes a method for providing transformed target points for integrating a component into an assembly. The process involves collecting component and assembly target points, identifying common target points, and performing Monte Carlo transformations to yield transformed target points and associated uncertainty values. This innovative approach aids in the precise integration of components, ensuring that uncertainties are effectively managed.
Career Highlights
Manal A Khreishi is associated with the United States of America as represented by the Administrator of NASA. Her role at NASA highlights her commitment to advancing technology and improving measurement techniques. With her expertise, she contributes to projects that require high precision and reliability.
Collaborations
Khreishi has worked alongside notable colleagues such as Theodore A Hadjimichael and Raymond Ohl. These collaborations have further enriched her research and development efforts, allowing for a multidisciplinary approach to solving complex problems in metrology.
Conclusion
Manal A Khreishi is a trailblazer in the field of metrology, with her innovative patent addressing critical challenges in uncertainty propagation. Her contributions not only enhance measurement accuracy but also pave the way for future advancements in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile