Yamatokoriyama, Japan

Mamoru Suzuki

This inventor holds 1 USPTO granted patent. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mamoru Suzuki. Retrieved from https://idiyas.com/inventor/mamoru-suzuki-4ckhqv1q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Mamoru Suzuki: Innovator in Semiconductor Technology

Introduction

Mamoru Suzuki is a notable inventor based in Yamatokoriyama, Japan. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for detecting and analyzing defective portions of semiconductor elements.

Latest Patents

Mamoru Suzuki holds 1 patent for his invention titled "Method of detecting and analyzing defective portion of semiconductor." This method involves several steps, including setting a semiconductor element on a stage of an emission microscope, observing the surface while supplying electric power, and storing positional information of light emission portions. The process allows for detailed analysis and identification of defects in semiconductor elements.

Career Highlights

Mamoru Suzuki is associated with Sharp Kabushiki Kaisha Corporation, where he has been instrumental in advancing semiconductor technologies. His work has contributed to the efficiency and reliability of semiconductor devices, which are crucial in various electronic applications.

Collaborations

Mamoru Suzuki has collaborated with Tomoo Imataki, enhancing the research and development efforts in their field. Their partnership has fostered innovation and has led to advancements in semiconductor analysis techniques.

Conclusion

Mamoru Suzuki's contributions to semiconductor technology exemplify the impact of innovative thinking in engineering. His patented method for detecting defects in semiconductors showcases his expertise and commitment to improving electronic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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