Escondido, CA, United States of America

Malcolm Vincent Hawkes


Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 41(Granted Patents)


Company Filing History:


Years Active: 1998-2005

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3 patents (USPTO):Explore Patents

Title: Malcolm Vincent Hawkes: Innovator in Microelectronics Inspection

Introduction

Malcolm Vincent Hawkes is an accomplished inventor based in Escondido, California. Throughout his career, he has been responsible for significant technological advancements in the field of microelectronics inspection, holding a total of three patents. His innovative contributions have played a pivotal role in refining the techniques used to visually inspect micro-electronic chips, ensuring higher accuracy and efficiency in the industry.

Latest Patents

Malcolm's most recent inventions include:

1. **Shadow-creating Depression for Establishing Microchip Location During Visual Inspection**

This apparatus is designed to accurately locate a micro-electronic chip within a holding cavity for visual testing. It features a cavity side wall that forms a depression to create a shadow, allowing for an objectively measurable contrast in grayness between the shadow and the chip.

2. **Inspection Machine for Surface Mount Passive Component**

This invention is a visual inspection machine specifically created for surface mount passive components (chips). The machine incorporates a rotating circular loader wheel with numerous cavities to hold individual chips. It includes advanced inspection stations, a computer processor for tracking inspection outcomes, and mechanisms for removing chips based on inspection results.

Career Highlights

Malcolm Vincent Hawkes has spent a significant portion of his career at Electro Scientific Industries, Inc., where he has developed groundbreaking technologies for the microelectronics sector. His expertise in creating solutions that streamline inspection processes has earned him recognition as a leading figure in this niche area.

Collaborations

Throughout his career, Malcolm has collaborated with notable professionals including Jeffrey L. Fish and Douglas John Garcia. These partnerships have contributed to the development of innovative inspection systems that enhance productivity and precision in micro-electronic chip testing.

Conclusion

Malcolm Vincent Hawkes exemplifies the spirit of innovation within the field of microelectronics. Through his patents and collaborations, he has made significant strides in improving visual inspection methodologies. As technology continues to evolve, Malcolm's contributions will likely serve as benchmarks for future advancements in the industry.

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