Katano, Japan

Makoto Terashima

This inventor holds 2 USPTO granted patents. Top assignee: Seiko Epson Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Terashima. Retrieved from https://idiyas.com/inventor/makoto-terashima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 26(Granted Patents)


Location History:

  • Katano, JP (2016)
  • Shiojiri, JP (2016)

Company Filing History:


Years Active: 2016

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2 patents (USPTO):Explore Patents

Title: Makoto Terashima: Innovator in Display Technology

Introduction

Makoto Terashima is a prominent inventor based in Katano, Japan. He has made significant contributions to the field of display technology, holding a total of 2 patents. His work has been instrumental in advancing the capabilities of display panels and printers.

Latest Patents

Among his latest patents, Terashima has developed innovative solutions for display panels and printers. These inventions reflect his commitment to enhancing user experience and improving the functionality of electronic devices.

Career Highlights

Terashima is currently employed at Seiko Epson Corporation, a leading company in the printing and imaging industry. His role at Epson allows him to leverage his expertise in display technology to contribute to the company's innovative product lineup.

Collaborations

Throughout his career, Terashima has collaborated with talented individuals such as Tomohisa Kano and Katsuyuki Endo. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

In summary, Makoto Terashima is a dedicated inventor whose work in display technology has led to significant advancements in the industry. His contributions continue to shape the future of electronic displays and printing solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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