Tokyo, Japan

Makoto Sakashita

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Daifuku Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Sakashita. Retrieved from https://idiyas.com/inventor/makoto-sakashita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Makoto Sakashita: Inventor of an Automated Warehouse System.

Introduction

Makoto Sakashita is an inventor based in Tokyo, Japan, associated with Daifuku Ltd. His work includes an invention designed to improve the identification and tracking of articles in automated warehouses.

Latest Patents

Sakashita is named on 1 patent, titled “Automated warehouse.” The invention describes a warehouse system with storage racks, a loading section, a transport apparatus, and a control unit. Each article carries a wireless tag containing unique identification information, which a reader at the loading section can scan. During loading, the control unit checks whether the scanned identification matches information already recorded for another article. If there is no match, the system records the identification for the article being loaded.

Career Highlights

Sakashita’s listed patent reflects an interest in warehouse automation and reliable article identification. The system’s tag-reading and record-checking process is intended to help manage loading operations and distinguish articles within the warehouse.

Collaborations

Sakashita is associated with Daifuku Ltd. His listed coworkers include Wataru Kiyokawa and Shimon Katsura.

Conclusion

Makoto Sakashita’s patented automated warehouse system combines wireless identification with control-unit recordkeeping to support accurate article handling during loading.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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