Ritto, Japan

Makoto Nakatani



Average Co-Inventor Count = 3.3

ph-index = 1


Company Filing History:


Years Active: 2015-2024

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3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Makoto Nakatani

Introduction

Makoto Nakatani is a prominent inventor based in Ritto, Japan. He has made significant contributions to the field of inspection and measurement devices, holding a total of 3 patents. His work focuses on enhancing the efficiency and accuracy of various inspection processes.

Latest Patents

Nakatani's latest patents include an advanced inspection device and a mass measurement device. The inspection device is designed to inspect goods that contain multiple articles, which may sometimes overlap. It utilizes X-ray technology to irradiate these goods and generates inspection images based on the radiation that passes through or reflects off the items. This device features a storage component that retains teaching images of overlapping articles, a learning component that employs machine learning to identify relevant features, and an inspection component that utilizes these features for accurate assessments.

The mass measurement device comprises a force sensor, a hose, a base part, an article-holding part, and a computation unit. The force sensor outputs a signal based on the force applied in a specific direction. The hose facilitates the passage of suctioned air, while the article-holding part secures the item through air suction. The computation unit calculates the mass of the article based on the sensor's output.

Career Highlights

Makoto Nakatani is currently employed at Ishida Co. Limited, where he continues to innovate and develop new technologies. His work has significantly impacted the efficiency of inspection and measurement processes in various industries.

Collaborations

Nakatani collaborates with talented coworkers, including Akihito Suzuki and Yoshinori Tarumoto. Their combined expertise fosters a creative environment that drives innovation.

Conclusion

Makoto Nakatani's contributions to the field of inspection and measurement devices demonstrate his commitment to advancing technology. His innovative patents reflect a deep understanding of the challenges faced in these areas and provide effective solutions.

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