This inventor holds 2 USPTO granted patents. Top assignee: Fujitsu Corporation. Active years: 1992-1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Yokohama, JP (1992)
- Kawasaki, JP (1994)
Company Filing History:
Years Active: 1992-1994
Title: The Innovations of Makoto Itoh
Introduction
Makoto Itoh is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of infrared detection technology. With a total of 2 patents, his work has advanced the capabilities of infrared sensors.
Latest Patents
Itoh's latest patents include an "Infrared ray detecting sensor with getter partition" and an "Infrared detector having dewar with film coatings to suppress reflections." The first patent describes an infrared ray detecting sensor that features an infrared ray detecting element located in the cool chamber of a Dewar structure. This design includes a getter to maintain the vacuum level and a partition that allows gas communication while obstructing stray rays. The second patent focuses on an infrared detector that prevents faulty detection caused by stray infrared rays. It utilizes a black film and a multilayer film to suppress reflections, enhancing the accuracy of infrared sensing elements.
Career Highlights
Makoto Itoh is currently employed at Fujitsu Corporation, where he continues to innovate in the field of infrared technology. His work has been instrumental in developing advanced detection systems that are crucial for various applications.
Collaborations
Itoh has collaborated with notable coworkers such as Shigeki Hamashima and Koji Hirota. Their combined expertise has contributed to the success of their projects and patents.
Conclusion
Makoto Itoh's contributions to infrared detection technology demonstrate his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving sensor accuracy and functionality.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
