Noda, Japan

Makoto Imura

This inventor holds 1 USPTO granted patent. Top assignees: Japan Silicon Co., Ltd., Mitsubishi Kinzoku Kabushiki Kaisha. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Imura. Retrieved from https://idiyas.com/inventor/makoto-imura-ttrdv3rv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Makoto Imura

Introduction

Makoto Imura is a notable inventor based in Noda, Japan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent that enhances the evaluation of semiconductor characteristics.

Latest Patents

Imura holds a patent for a "Method for contactless evaluation of characteristics of semiconductor." This invention discloses a method that includes several steps: continuously irradiating focused microwaves on a semiconductor specimen's surface, receiving reflected microwaves, and irradiating a focused laser beam pulse. The method allows for the measurement of lifetime and the calculation of surface recombination velocity and bulk lifetime. The combination of focused microwaves and laser beams improves measurement resolution, making it a valuable advancement in semiconductor evaluation.

Career Highlights

Throughout his career, Makoto Imura has worked with prominent companies such as Mitsubishi Kinzoku Kabushiki Kaisha and Japan Silicon Co., Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Imura has collaborated with various professionals in his field, including Akira Usami, which has further enriched his work and contributions to semiconductor technology.

Conclusion

Makoto Imura's innovative methods for evaluating semiconductor characteristics demonstrate his significant impact on the field. His work continues to influence advancements in semiconductor technology and evaluation techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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