Toyama, Japan

Makoto Imaoka

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nachi - Fujikoshi Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Imaoka. Retrieved from https://idiyas.com/inventor/makoto-imaoka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Makoto Imaoka: Innovator in Three-Dimensional Sensor Technology

Introduction

Makoto Imaoka is a notable inventor based in Toyama, Japan. He has made significant contributions to the field of three-dimensional sensor technology. His innovative work focuses on enhancing the capabilities of environment mapping through advanced sensor control devices.

Latest Patents

Imaoka holds a patent for an "Environment map generation program and three-dimensional sensor control device." This invention involves a sophisticated process where a three-dimensional sensor acquires orthogonal coordinates from multiple photograph frames. The device converts these coordinates into polar coordinates and searches for the farthest data points within the photographing range. Ultimately, it outputs environment map data using the orthogonal coordinates of these points.

Career Highlights

Makoto Imaoka is associated with Nachi-Fujikoshi Corporation, a company known for its advancements in manufacturing and technology. His work at the company has allowed him to develop and refine his innovative ideas in sensor technology.

Collaborations

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Conclusion

Makoto Imaoka's contributions to three-dimensional sensor technology exemplify the spirit of innovation. His patent reflects a commitment to advancing the capabilities of environmental mapping, showcasing the potential of modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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