Fussa, Japan

Makio Iwamoto

This inventor holds 1 USPTO granted patent. Top assignee: Kaisei Engineer Co., Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makio Iwamoto. Retrieved from https://idiyas.com/inventor/makio-iwamoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Makio Iwamoto: Innovator in Electromagnetic Inspection Technology

Introduction

Makio Iwamoto is a notable inventor based in Fussa, Japan. He has made significant contributions to the field of electromagnetic inspection technology. His innovative approach has led to the development of a unique inspection device that enhances accuracy and sensitivity.

Latest Patents

Iwamoto holds a patent for an "Electromagnetic induction type inspection device and method." This invention allows for the inspection of various materials with high accuracy and sensitivity. The device operates by placing an inspection object in a magnetic field generated by an alternating current applied to an exciting coil. It detects changes in voltage level and phase of electromotive force induced by a detection coil unit. The discrimination of the inspection object is based on a DC voltage value compared to a standard specimen and a phase differential voltage value.

Career Highlights

Makio Iwamoto is associated with Kaisei Engineer Co., Ltd., where he continues to innovate in the field of inspection technology. His work has garnered attention for its practical applications in various industries.

Collaborations

Iwamoto collaborates with talented individuals such as Takayuki Yamaki and Ichiro Fujitomi. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

Makio Iwamoto's contributions to electromagnetic inspection technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to enhancing inspection methods, making significant strides in accuracy and sensitivity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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