Tokyo, Japan

Makiko Nagashima


 

Average Co-Inventor Count = 2.3

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2014-2017

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3 patents (USPTO):Explore Patents

Title: Makiko Nagashima: Innovator in Fluoroscopic Imaging Technology

Introduction

Makiko Nagashima is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of imaging technology, particularly in the area of fluoroscopic image processing. With a total of 3 patents to her name, her work has advanced non-destructive inspection methods, enhancing the accuracy and reliability of weld inspections.

Latest Patents

Nagashima's latest patents include a fluoroscopic image density correction method and an image processing device. These innovations involve generating a reference density profile in the outer circumference direction of a pipe with a reference welded portion. This is achieved by utilizing a reference fluoroscopic image produced from a radiation detection medium when a radiation source is positioned along the central axis of the pipe. Additionally, a weld inspection density profile is created based on a weld inspection fluoroscopic image. By comparing the reference and weld inspection density profiles, density correction information is calculated to address irregularities in the weld inspection fluoroscopic image. This method significantly improves the quality of non-destructive inspections.

Career Highlights

Makiko Nagashima is currently employed at Fujifilm Corporation, where she continues to innovate in imaging technologies. Her work has been instrumental in developing methods that enhance the precision of weld inspections, which are critical in various industrial applications.

Collaborations

Throughout her career, Nagashima has collaborated with notable colleagues, including Yasunori Narukawa and Yoshikazu Matsumoto. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Makiko Nagashima's contributions to fluoroscopic imaging technology exemplify her dedication to advancing non-destructive inspection methods. Her innovative patents and collaborative efforts continue to impact the field positively.

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