Kfar Qassem, Israel

Majed Amer

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Industry Software Gmbh. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Majed Amer. Retrieved from https://idiyas.com/inventor/majed-amer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Majed Amer - Innovator in Machining Methods

Introduction

Majed Amer is a notable inventor based in Kfar Qassem, Israel. He has made significant contributions to the field of machining methods, particularly through his innovative patent. His work focuses on enhancing the manufacturing process of features in various parts.

Latest Patents

Majed Amer holds a patent titled "Process and system for providing a machining method for manufacturing a feature in a part." This patent describes a machining method that involves receiving feature data, which includes the type and attributes of the feature to be manufactured. The method analyzes machining methods associated with specific feature types to define applicable ranges of feature attributes. It also assigns ranking values to each machining method, allowing for the selection of the most suitable method based on its ranking for additional features.

Career Highlights

Majed Amer is currently employed at Siemens Industry Software GmbH, where he continues to develop and refine machining methods. His expertise in this area has positioned him as a valuable asset to his team and the company.

Collaborations

Some of his coworkers include Yahel Aricha and Tom Van 't Erve, who collaborate with him on various projects within the company.

Conclusion

Majed Amer's innovative approach to machining methods has led to advancements in manufacturing processes. His contributions are significant in the field, and his patent reflects his commitment to improving efficiency and effectiveness in part manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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