Croton-on-Hudson, NY, United States of America

Maheswaren Surendra


Average Co-Inventor Count = 12.0

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2008-2010

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2 patents (USPTO):Explore Patents

Title: Maheswaren Surendra: Innovator in CMOS Technology

Introduction

Maheswaren Surendra is a notable inventor based in Croton-on-Hudson, NY (US). He has made significant contributions to the field of semiconductor technology, particularly in the area of complementary metal oxide semiconductor (CMOS) integration. With a total of 2 patents to his name, Surendra's work has had a substantial impact on the industry.

Latest Patents

Surendra's latest patents focus on the integration of silicided metal gates in CMOS technology. The first patent describes a process whereby a plurality of silicided metal gates are fabricated atop a gate dielectric. Each silicided metal gate formed using this integration scheme maintains the same silicide metal phase and height, regardless of the gate's dimensions. This innovation also includes methods for creating a CMOS structure with silicided contacts, ensuring that the polySi gate heights are uniform across the semiconductor surface.

Career Highlights

Maheswaren Surendra is currently employed at International Business Machines Corporation (IBM), where he continues to advance semiconductor technology. His expertise in CMOS integration has positioned him as a key player in the field, contributing to the development of more efficient and reliable semiconductor devices.

Collaborations

Throughout his career, Surendra has collaborated with notable colleagues, including Ricky S Amos and Diane Catherine Boyd. These partnerships have fostered innovation and have been instrumental in the successful development of his patented technologies.

Conclusion

Maheswaren Surendra's contributions to CMOS technology exemplify the importance of innovation in the semiconductor industry. His patents reflect a commitment to advancing technology and improving the performance of semiconductor devices.

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