Bazancourt, France

Mahamadou Mounkaila

This inventor holds 1 USPTO granted patent. Top assignees: Centralesupelec, Universite Dé Lorraine. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mahamadou Mounkaila. Retrieved from https://idiyas.com/inventor/mahamadou-mounkaila

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mahamadou Mounkaila: Innovator in Medium Detection Technology

Introduction

Mahamadou Mounkaila is an inventor based in Bazancourt, France. He has made significant contributions to the field of detection technology, particularly in the analysis of various mediums. His innovative approach focuses on utilizing advanced spectrometry techniques to gather critical data.

Latest Patent Applications

Mounkaila's notable patent application is titled "FACILITY FOR DETECTING AT LEAST ONE CHARACTERISTIC PARAMETER OF A MEDIUM, AND METHOD FOR DETECTING AT LEAST ONE SUCH CHARACTERISTIC PARAMETER." This application describes a facility designed to detect at least one characteristic parameter of a medium. The facility includes a device that illuminates the medium with visible polychromatic light, a device that excites the medium with visible-light or infrared monochromatic radiation, and multiple devices that collect and convey electromagnetic radiation emitted by the medium. Additionally, it features at least one visible-band spectrometer and at least one Raman spectrometer to obtain the respective spectra of the medium. The system is designed to detect characteristic parameters from the gathered spectral data.

Conclusion

Mahamadou Mounkaila's work in detection technology showcases his innovative spirit and dedication to advancing scientific understanding. His contributions, particularly through his patent application, highlight the potential for new methods in analyzing mediums.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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