Toronto, Canada

Madeline K Y Fok

This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2008-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Madeline K Y Fok. Retrieved from https://idiyas.com/inventor/madeline-k-y-fok

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2008-2010

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2 patents (USPTO):Explore Patents

Title: Madeline K Y Fok: Innovator in Commerce Context Management

Introduction

Madeline K Y Fok is a notable inventor based in Toronto, Canada. He has made significant contributions to the field of commerce context management, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

His latest patents include a method for managing commerce contexts. This method facilitates the interaction between a direct commerce context and a temporary commerce context during a client session. The commerce context parameters are associated with both the direct and temporary commerce contexts. The system determines the commerce context linked to a client request based on these parameters.

Career Highlights

Madeline is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to explore and develop advanced methodologies in commerce management.

Collaborations

He has collaborated with notable colleagues, including Victor Chan and Robert M H Dunn, contributing to a dynamic work environment that fosters innovation.

Conclusion

Madeline K Y Fok's contributions to commerce context management reflect his expertise and commitment to advancing technology. His patents and work at IBM highlight his role as a key innovator in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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