Cracow, Poland

Maciej Wielgosz

This inventor holds 1 USPTO granted patent. Top assignee: Akademia Gorniczo-Hutnicza Im. Stanislawa Staszica. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maciej Wielgosz. Retrieved from https://idiyas.com/inventor/maciej-wielgosz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Maciej Wielgosz: Innovator in X-ray Technology

Introduction

Maciej Wielgosz is a prominent inventor based in Cracow, Poland. He has made significant contributions to the field of X-ray technology, particularly in the development of circuits for pixel readout channels. His innovative work has led to the creation of a patented technology that enhances the accuracy of X-ray measurements.

Latest Patents

Wielgosz holds a patent for a "Circuit and method for X-ray induced voltage pulse amplitude estimation in pixel readout channel." This invention involves a circuit designed to estimate the amplitude of voltage pulses induced by X-rays within a pixel readout channel of a hybrid pixel array detector. The circuit features a charge-sensitive amplifier (CSA) that amplifies the current pulse from the pixel electrode and converts it into a voltage pulse. Additionally, it includes an analog to digital converter (ADC) that samples the input voltage signal and outputs the result as a codeword. An artificial neural network (ANN) block operates in conjunction with the ADC to estimate the amplitude of the voltage pulse, enhancing the overall functionality of the system.

Career Highlights

Wielgosz is affiliated with the AGH University of Science and Technology, where he continues to advance his research in the field of X-ray technology. His work has garnered attention for its innovative approach to improving the accuracy of X-ray measurements, which is crucial in various applications, including medical imaging and materials analysis.

Collaborations

He collaborates with notable colleagues such as Anna Koziol and Piotr Maj, contributing to a dynamic research environment that fosters innovation and technological advancement.

Conclusion

Maciej Wielgosz is a key figure in the realm of X-ray technology, with a focus on enhancing measurement accuracy through innovative circuit design. His contributions are paving the way for advancements in various fields that rely on precise X-ray measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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