Cambridge, United Kingdom

Maciej Kukla

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maciej Kukla. Retrieved from https://idiyas.com/inventor/maciej-kukla

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Maciej Kukla: Inventor in Knowledge Base Construction

Introduction

Maciej Kukla is an inventor based in Cambridge, Great Britain. His work includes a patent for constructing and maintaining probabilistic knowledge bases. The patent lists Microsoft Technology Licensing, LLC as the company associated with the invention.

Latest Patents

Kukla’s listed patent, “Knowledge base construction,” describes a system for building or maintaining a probabilistic knowledge base. It uses a generative model that can produce text or other formatted data from the knowledge base. An inference component applies algorithms to the model in either a forward direction, generating data, or a reverse direction, using observed data to infer unobserved variables. The system can then update the knowledge base using some of the inference results. The supplied information lists 1 patent for Kukla.

Career Highlights

The available information connects Kukla’s patent work with Microsoft Technology Licensing, LLC. The invention focuses on combining probabilistic modeling and inference to support knowledge-base construction and maintenance.

Collaborations

The supplied information names John Michael Winn and John Guiver as Kukla’s coworkers. Their names are associated with his professional context, though no specific roles in the patent are provided.

Conclusion

Maciej Kukla’s listed invention applies probabilistic models and inference to the construction and maintenance of knowledge bases, reflecting a practical approach to managing structured information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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