This inventor holds 1 USPTO granted patent. Top assignee: Regents of the University of Minnesota. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1997
Title: Maarten P De Boer: Innovator in Thin Film Separation Technology
Introduction
Maarten P De Boer is an accomplished inventor based in Saint Paul, MN (US). He has made significant contributions to the field of materials science, particularly in the area of thin film technology. His innovative approach has led to the development of a unique method for separating thin films from substrates.
Latest Patents
Maarten P De Boer holds a patent for a "Method and apparatus for separating a thin film from a substrate." This invention involves an apparatus and method designed to separate a thin film from a substrate, where the thin film has a surface with a selected width. The apparatus includes an indenter that applies a force to the surface of the thin film, ensuring that the force is uniformly distributed along the selected width. The indenter is crafted from a block of material with a substantially flat surface that engages with the thin film's surface. This design allows for accurate analysis of the work of adhesion based on two-dimensional geometry mechanics. He has 1 patent to his name.
Career Highlights
Maarten P De Boer is affiliated with the Regents of the University of Minnesota, where he continues to advance research in thin film technologies. His work has garnered attention for its practical applications in various industries, including electronics and materials engineering.
Collaborations
Some of his notable coworkers include He Huang and William W Gerberich, who have collaborated with him on various research projects related to thin film technologies.
Conclusion
Maarten P De Boer is a prominent figure in the field of thin film separation technology. His innovative methods and dedication to research continue to influence advancements in materials science.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
