Foothill Ranch, CA, United States of America

M Neil Houston

This inventor holds 2 USPTO granted patents. Top assignee: Oakley, Inc.. Active years: 1996-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: M Neil Houston. Retrieved from https://idiyas.com/inventor/m-neil-houston

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 387(Granted Patents)


Company Filing History:


Years Active: 1996-1999

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2 patents (USPTO):Explore Patents

Title: M Neil Houston: Innovator in Eyewear Technology

Introduction

M Neil Houston is a notable inventor based in Foothill Ranch, California. He has made significant contributions to the field of eyewear, particularly in the design and functionality of eyeglasses. With a total of 2 patents to his name, Houston has established himself as a key player in the industry.

Latest Patents

Houston's latest patents focus on innovative eyewear solutions. His work has led to advancements that enhance the user experience and improve the overall functionality of eyeglasses. These patents reflect his commitment to pushing the boundaries of eyewear technology.

Career Highlights

Houston is currently employed at Oakley, Inc., a leading company in the eyewear industry. His role at Oakley allows him to collaborate with other talented individuals and contribute to the development of cutting-edge eyewear products.

Collaborations

Throughout his career, Houston has worked alongside notable colleagues such as James H. Jannard and Peter Yee. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

M Neil Houston's contributions to eyewear technology through his patents and work at Oakley, Inc. highlight his dedication to innovation in the industry. His collaborations with other talented professionals further enhance his impact on the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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