Hsinchu, Taiwan

Lun-Han Chang

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Mediatek Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lun-Han Chang. Retrieved from https://idiyas.com/inventor/lun-han-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Lun-Han Chang: Innovator in Measurement Scheduling Control

Introduction

Lun-Han Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of telecommunications, particularly in the area of measurement scheduling control for user equipment.

Latest Patents

Lun-Han Chang holds a patent titled "Method for performing measurement scheduling control by user equipment, and associated apparatus." This innovative method involves establishing a connection with a base station and obtaining sensor information from a sensor system within the user equipment. The approach aims to control the periodicity of measurement cycles based on sensor data, ultimately reducing power consumption of the user equipment. He has 1 patent to his name.

Career Highlights

Lun-Han Chang is currently employed at MediaTek Corporation, a leading global semiconductor company. His work focuses on enhancing the efficiency and performance of telecommunications systems.

Collaborations

Some of his notable coworkers include Chih-Chieh Lai and Jianwei Zhang, who contribute to the innovative environment at MediaTek Corporation.

Conclusion

Lun-Han Chang's work in measurement scheduling control exemplifies the importance of innovation in telecommunications. His contributions continue to influence the efficiency of user equipment in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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