Sandy Hook, CT, United States of America

Luis Markoya

This inventor holds 1 USPTO granted patent. Top assignee: Asml Holding N.v.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Luis Markoya. Retrieved from https://idiyas.com/inventor/luis-markoya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovation Journey of Luis Markoya: Pushing Boundaries in Lithographic Printing Tools

Introduction:

Luis Markoya, a visionary inventor based in Sandy Hook, CT (US), exemplifies unwavering commitment to innovation. His pioneering work continues to inspire inventors worldwide.

Latest Patents:

Luis Markoya holds a groundbreaking patent for the Use of multiple reticles in lithographic printing tools. This invention involves a reticle stage with a range of motion to scan distinct reticles, enhancing efficiency in the photolithographic process.

Career Highlights:

Working at ASML Holding N.V., Luis Markoya has made significant contributions to the field of lithographic printing tools. His expertise and dedication have led to the development of cutting-edge technologies.

Collaborations:

Collaborating with coworkers Andrew W McCullough and Christopher John Mason, Luis Markoya has fostered a culture of innovation and excellence. Together, they have pushed the boundaries of what is possible in the realm of lithographic printing.

Conclusion:

Luis Markoya's journey as an inventor reflects a relentless pursuit of innovation and excellence. His pioneering spirit and collaborative efforts have paved the way for advancements in lithographic printing tools, making a lasting impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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