Collegno, Italy

Luigi Nobile

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Prima Industrie S.p.a.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Luigi Nobile. Retrieved from https://idiyas.com/inventor/luigi-nobile

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Luigi Nobile and Industrial Process Monitoring

Introduction

Luigi Nobile is an inventor based in Collegno, Italy, who works at Prima Industrie S.p.A. His patent work concerns monitoring industrial processes, particularly those performed by laser processing machines.

Latest Patents

Nobile is associated with 1 patent: “Method of Monitoring Industrial Processing Processes, Corresponding Apparatus and Computer Program Product.” The invention describes sensing time-varying signals from an industrial process and classifying them to determine the process state. It represents selected signals as digital images, including time-based maps, and combines images from different signal subsets into a composite image. A classification operation applied to that composite image produces a signal indicating the process state, which can be provided to an interface unit to control processing.

Career Highlights

Nobile’s listed invention applies signal sensing, image representation, and classification to industrial process monitoring. The approach is intended to help assess and control processing operations, including laser-based manufacturing.

Collaborations

Nobile works at Prima Industrie S.p.A. His listed coworkers include Andrea Bertaldi and Stefano Albrile.

Conclusion

Luigi Nobile’s patent focuses on using sensor data and image-based classification to monitor industrial processing and support control of manufacturing operations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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