Oelegem, Belgium

Ludovicus Diels

This inventor holds 1 USPTO granted patent. Top assignee: Vito. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ludovicus Diels. Retrieved from https://idiyas.com/inventor/ludovicus-diels-dya1tb6v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Ludovicus Diels: Innovator in Metal Detection Technology

Introduction

Ludovicus Diels is a notable inventor based in Oelegem, Belgium. He has made significant contributions to the field of biotechnology, particularly in the area of metal detection through innovative genetic techniques. His work has implications for various industries, including environmental monitoring and safety.

Latest Patents

Diels holds a patent for "Fused genes and their use for determining the presence of metals." This invention showcases his expertise in genetic engineering and its application in detecting metal contaminants, which is crucial for environmental health and safety.

Career Highlights

Ludovicus Diels is associated with Vito, a research organization that focuses on sustainable development and innovation. His role at Vito allows him to collaborate with other experts in the field and contribute to groundbreaking research.

Collaborations

Diels has worked alongside talented colleagues such as Philippe Corbisier and Maximilien Mergeay. Their combined efforts enhance the research capabilities at Vito and lead to advancements in biotechnology.

Conclusion

Ludovicus Diels is a prominent figure in the realm of biotechnology, with a focus on innovative solutions for metal detection. His contributions are vital for advancing environmental safety and health.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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