Heverlee, Belgium

Luc Van Den Hove

This inventor holds 1 USPTO granted patent. Top assignee: Imec Vzw. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Luc Van Den Hove. Retrieved from https://idiyas.com/inventor/luc-van-den-hove

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Luc Van Den Hove: Innovator in Photoresist Development

Introduction

Luc Van Den Hove is a notable inventor based in Heverlee, Belgium. He has made significant contributions to the field of photoresist technology, particularly in the development process. His innovative approach has led to advancements that enhance the efficiency of photoresist applications.

Latest Patents

Luc Van Den Hove holds a patent for an "Interrupted developing process for a photoresist image." This process improves the development of photoresist by subjecting it to heat before the completion of the development process. This innovative method enhances the quality and precision of photoresist images.

Career Highlights

Luc is currently associated with Imec Vzw, a leading research and innovation hub in nanoelectronics and digital technologies. His work at Imec Vzw has positioned him at the forefront of technological advancements in the field.

Collaborations

Throughout his career, Luc has collaborated with esteemed colleagues, including Nandasiri Samarakone and Patrick Jaenen. These collaborations have fostered a productive environment for innovation and research.

Conclusion

Luc Van Den Hove's contributions to photoresist technology exemplify the impact of innovative thinking in the field of electronics. His patent and work at Imec Vzw highlight his role as a key player in advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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