Luang-Terng Wang

Title: Luang-Terng Wang: Innovator in Integrated Circuit Testing

Introduction

Luang-Terng Wang is a notable inventor based in Sunnyvale, California. He has made significant contributions to the field of integrated circuit testing, particularly in the detection and location of faults within clock domains.

Latest Patents

Wang holds a patent for a "Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test." This innovative method provides ordered capture clocks to detect or locate faults within multiple clock domains in an integrated circuit or circuit assembly. The patent outlines a process that includes generating test stimuli, applying an ordered sequence of capture clocks, and analyzing output responses to locate any faults.

Career Highlights

Luang-Terng Wang is currently employed at Syntest Technologies, Inc., where he continues to advance his work in integrated circuit testing. His expertise in the field has led to the development of methods that enhance the reliability and efficiency of electronic devices.

Collaborations

Wang has collaborated with notable colleagues such as Po-Ching Hsu and Shih-Chia Kao, contributing to various projects that aim to improve testing methodologies in integrated circuits.

Conclusion

Luang-Terng Wang's innovative work in integrated circuit testing has made a significant impact on the industry. His contributions continue to shape the future of electronic device reliability and performance.