Toulouse, France

Louis Labrot-Rhodes

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Continental Automotive Technologies Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Louis Labrot-Rhodes. Retrieved from https://idiyas.com/inventor/louis-labrot-rhodes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Louis Labrot-Rhodes and Tire RFID Technology.

Introduction

Louis Labrot-Rhodes is an inventor associated with Toulouse, France, and Continental Automotive Technologies GmbH. His patent work concerns reading information from an RFID chip embedded in a motor vehicle tire.

Latest Patents

The available information lists one patent for Labrot-Rhodes: “Method for Reading Information Contained in an RFID Chip Embedded in a Vehicle Tire.” The method uses a wheel unit in a tire pressure monitoring system to detect wheel removal and subsequent tire reinflation, whether or not the wheel is punctured. Once reinflation is detected, the wheel unit polls the tire’s embedded RFID chip to read its information. The listed patent count is 1 patent.

Career Highlights

Labrot-Rhodes’s listed invention connects tire identification with the operation of a tire pressure monitoring system. By triggering the RFID read after detecting reinflation, the method provides a defined point for retrieving information from the replacement or serviced tire.

Collaborations

The supplied information identifies Rémi Fontugne as a coworker. Labrot-Rhodes is also associated with Continental Automotive Technologies GmbH.

Conclusion

Louis Labrot-Rhodes’s listed patent describes an RFID-reading method that links tire information retrieval to wheel removal and reinflation events.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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