Raleigh, NC, United States of America

Louis J LaMarche, Jr

This inventor holds 1 USPTO granted patent. Top assignee: Huyck Corporation. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Louis J LaMarche, Jr. Retrieved from https://idiyas.com/inventor/louis-j-lamarche-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Louis J LaMarche, Jr: Innovator in Papermaking Technology

Introduction

Louis J LaMarche, Jr. is a notable inventor based in Raleigh, NC (US). He has made significant contributions to the field of papermaking technology. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of papermaking processes.

Latest Patents

LaMarche holds a patent for a "Drainage profile tester for papermaking." This invention is an apparatus and method designed to measure the amount of papermaking stock on a moving fabric in a fourdrinier papermaking machine. The device includes a backscattering mass sensing device and a hydrofoil blade that scrapes water from the underside of the fabric. This design allows the mass sensing device to be positioned close to the papermaking belt, improving measurement accuracy.

Career Highlights

LaMarche is currently employed at Huyck Corporation, where he continues to work on advancements in papermaking technology. His expertise and innovative mindset have made him a valuable asset to the company.

Collaborations

One of his notable coworkers is G Roy Jones, with whom he collaborates on various projects within the company.

Conclusion

Louis J LaMarche, Jr. is a distinguished inventor whose work in papermaking technology has made a lasting impact. His innovative patent demonstrates his commitment to improving industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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