Lothar Houben

Title: Lothar Houben and His Patent in Scanning Microscopy

Introduction

Lothar Houben is an inventor associated with Yeda Research and Development Co. Ltd. in Rehovot, Israel. His listed patent focuses on extracting structural information from scanning microscope data. The record provided identifies 1 patent.

Latest Patents

Houben’s listed patent is titled “System and Method for Extraction of Structural Data of a Sample from Scan Data.” It describes a computer system that processes raw measurements from a scanning microscope to determine a structural image of a sample.

The system analyzes scan data collected through multiple detection channels associated with a segmented detector. It compensates for image shifts caused by off-axis detection channels when sample features are out of focus. This parallax correction can help separate phase and depth information and extract a depth-contrast image from a single scan dataset.

Career Highlights

The available information connects Houben’s patent work with Yeda Research and Development Co. Ltd., based in Rehovot, Israel. His listed invention applies computational analysis to scanning microscopy data, with the aim of improving the structural information that can be derived from a scan.

Collaborations

The supplied information names Michael Elbaum and Shahar Seifer as Houben’s coworkers. Their specific roles in the patent or related research are not detailed in the information provided.

Conclusion

Lothar Houben’s listed patent presents a method for correcting scanning-microscope data to reveal sample depth contrast and structural information.