Company Filing History:
Years Active: 2004
Title: Loris Scandella: Innovator in Scanning Probe Microscopy
Introduction
Loris Scandella is a notable inventor based in Pratteln, Switzerland. He has made significant contributions to the field of scanning probe microscopy through his innovative patent. His work focuses on enhancing the capabilities of scanning tips used in various types of microscopes.
Latest Patents
Loris Scandella holds a patent for a "Scanning tip and process for its production and use, particularly for a scanning probe microscope." This invention addresses the need for high-resolution scanning tips that are essential for accurately measuring objects in scanning force microscopes and other scanning probe microscopes. The patent describes a method of creating scanning tips using photostructurable materials, such as photosensitive resists. The process involves exposing the material through a mask, developing it, and hardening it to form a tip with a very small radius, which is ideal for precise measurements.
Career Highlights
Loris Scandella is associated with Nanosurf AG, a company known for its advancements in scanning probe microscopy technology. His work at Nanosurf AG has positioned him as a key player in the development of innovative solutions for microscopy applications.
Collaborations
Some of Loris Scandella's coworkers include Lukas Emanuel Howald and Urs Staufer. Their collaboration has likely contributed to the advancements in the technologies developed at Nanosurf AG.
Conclusion
Loris Scandella's contributions to the field of scanning probe microscopy through his innovative patent demonstrate his commitment to advancing scientific measurement techniques. His work continues to influence the development of high-resolution microscopy tools.